Titan 80-300 TEM
The FEI Titan family currently offers the Titan 80-300 TEM, the world’s most powerful, commercially-available scanning transmission electron microscope. Titan is the next generation of a unique 80-300 kV range microscope with 1.34 Angstrom resolution. The Titan system is poised to bring electron microscopy into a new era by expanding boundaries and assisting scientists and researchers to achieve ground-breaking results in nanoresearch. This electron microscope is equipped with a S-TWIN lens.
Key features:
- Alignments: 80, 200, 300 kV
- Field Emission Gun (X-FEG)
- S-TWIN Cryobox
- Computer-controlled compustage
- +/- 40° single tilt analytical holder (without cryobox)
- +/- 40/20° dual tilt analytical holder (without cryobox)
- +/- 70° single tilt tomography holder (without cryobox)
- +/- 30° tilt range with cryobox
- EDS (Oxford X-MaxN 100TLE 100 mm2 SDD for TEM)
- Scanning Transmission Electron Microscopy (STEM) with HAADF, DF4, DF2, BF detectors
- High Resolution STEM (HRSTEM)
- Cs = 1.2 mm
- Cc = 1.4 mm
- S/TEM tomography package
- TIA, image analysis software (FEI)
- Ultrascan, US1000 2K digital camera (Gatan) with Digital Micrograph GM3 software
- Direct Electron DE64 Camera with 4DSTEM package
- EPU-S software
- SerialEM software
You are required to have at least 10 hours of previous experience on any modern FEI TEM with compustage in order to be qualified for Titan 80-300 TEM training. Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.
Rates: Internal Academia rate: $70/hour; External Academia rate: $95/hour; Industry rate: $140/hour
