Quanta 650 FEG SEM

Description: The FEI Quanta 650 FEG scanning electron microscope is an instrument suitable for imaging surface morphologies for both materials and biological samples. It can be used in low vacuum and environmental SEM (ESEM) modes.

Key features:

• 200 eV – 30 keV operating voltage
• 1.2 nm (30 kV) and 2.9 nm (1 kV) resolution – high vacuum
• 1.4 nm (30 kV) – low vacuum and ESEM
• Montage imaging for large fields of view
• Several detectors:
  • Secondary electron (SE) detector for typical SEM imaging
  • Low vacuum detector (LVD) for imaging in a partially pressurized environment, 0.10 – 1.30 mbar
  • Environmental SEM (ESEM) for imaging high-vacuum incompatible samples, 0.10 – 40 mbar

Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.

Rates: Internal Academia rate: $50/hour; External Academia rate: $70/hour; Industry rate: $100/hour