Teneo SEM
Description: The FEI Teneo scanning electron microscope is an instrument suitable for imaging surface morphologies for both materials and biological samples. It is capable of beam deceleration, low vacuum operation, and elemental mapping.
Key features:
- 200 eV – 30 keV operating voltage
- Beam deceleration (BD) for down to 20 eV landing energy
- 1.0 nm (30 kV) and 1.4 nm (1 kV with BD) resolution
- Built-in plasma cleaner
- Montage imaging for large fields of view
- Several detectors:
- Secondary electron (SE) detector for typical SEM imaging
- In-Lens SE detectors for topographic imaging
- Multi-segment backscatter electron detectors (BSE) for Z-contrast imaging
- Low vacuum detector (LVD) for imaging in a partially pressurized environment, 10 – 50 Pa
- Energy dispersive X-ray (EDS) detector for elemental mapping (Oxford Ultim Max 100 mm2)
Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.
Rates: Internal Academia rate: $60/hour; External Academia rate: $85/hour; Industry rate: $120/hour
