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Electron Imaging Center for NanoMachines

EICN provides advanced electron imaging tools for applications ranging from materials science to structural biology

ZEISS Supra 40VP SEM

Description: SUPRAU 40VP Field Emission Scanning Electron Microscope is a high performance Variable Pressure FE-SEM with the GEMINI column technology equipped with Thermo Noran System SIX EDS system.

Key features:

  • Superb resolution and image quality at low operating voltages
  • Wide operating voltage range with minimal adjustments required
  • Short working distance of 8.5 mm for simultaneous high resolution imaging and X-ray analysis
  • High probe current (up to 20 nA) and high stability better than 0.2 %/h for analytical applications
  • High efficiency In-lens detector for clear topographic imaging in high vacuum mode
  • Enhanced VPSE detector in VP mode
  • Easy operation through Windows based SmartSEMTM control software
  • Dry Noran System Six EDS for elemental analysis

Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.

Rates: Internal Academia rate: $50/hour; External Academia rate: $70/hour; Industry rate: $100/hour