FEATURED NEWS
Two recent scanning electron microscope acquisitions offer versatility in high-resolution
Research into life sciences, materials and more gains from field emission gun scanning electron microscopes at the California NanoSystems Institute at UCLA
The ability to visualize structure at the smallest of scales is crucial for research across many areas of study. Field emission gun (FEG) scanning electron microscopes fulfill that purpose for investigators from biologists examining cell membranes, to electrical engineers probing the features of tiny semiconductor chips, to materials scientists interrogating the characteristics of newly developed substances.
To broaden possibilities for these scientists and engineers, the California NanoSystems Institute at UCLA has brought online two newly acquired scanning electron microscopes (SEMs) made by Thermo Fisher Scientific (TFS). The collection at the Electron Imaging Center for Nanosystems, a CNSI technology center, now includes the Quanta 650 FEG and the Teneo LoVac. Distinguished by their clarity and versatility, the instruments are available on a fee-for-service basis to researchers at UCLA or other academic institutions, as well as those working in industry.
They share a few things in common: Both microscopes have motorized eucentric tilt mechanisms, and both have pre-aligned electron columns optimized for beam stability and high-brightness, low-noise imaging. Their beam deceleration feature allows investigators to maximize contrast and surface sensitivity while improving optical performance.
The Quanta 650 FEG is a high-resolution, low-vacuum SEM with three vacuum modes, making it simple to switch between setups for conductive specimens, nonconductive specimens or specimens that are incompatible with a high-vacuum environment. For each mode, there is a detector that captures secondary electrons. Stage control software includes the capacity to arrange images as a montage for larger field of view and easier navigation. The 1536-by-1024-pixel display can show either single-frame or a four-quadrant view.
The Teneo LoVac, which also utilizes a field emission gun to source electrons, is a scanning electron microscope optimized for available automation — from its system architecture to stage mounting that makes it possible to simultaneously load 18 standard samples. Automated image stitching is available over a wide field of view. With a two-mode final lens and unique in-lens detection, the Teneo provides unprecedented contrast and flexibility for researchers studying metals and nanoscale materials or devices.
The Teneo is also equipped with a dedicated back-scatter detector capable of looking at topology and atomic number contrast modalities. Spectroscopic capacities are enabled through an energy-dispersive x-ray detector from Oxford. This platform, along with a next-generation TFS Verios 5 XHR SEM being installed in the CNSI clean room, have the best spatial resolution of any instrument on campus.
“These state-of-the-art Scanning Electron Microscopes (SEMs) offer unparalleled resolution, with the Quanta and Teneo instruments pushing the boundaries by revealing sub-nanometer details. As part of the EICN suite of advanced imaging tools, they promise to be indispensable for groundbreaking research, enabling scientists to unlock new insights into nanostructures and beyond”, said Matthew Mecklenburg, Managing Director of the EICN.
For general information, inquiries, consultation, training or assistance regarding the FEG SEMs, contact eicnhelp@cnsi.ucla.edu.