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June 24, 2021 | Next-gen electron source boosts resolution for atomic imaging

June 24, 2021 | Next-gen electron source boosts resolution for atomic imaging

by mroseboro | Jun 24, 2021 | Electron Imaging Center for Nanomachines, Research, Technology Centers, Tools for Discovery | 0 comments

TECHNOLOGY CENTER ANNOUNCEMENT Next-gen electron source boosts resolution for atomic imaging X-FEG upgrades electron microscopy capabilities for CNSI at UCLA users by Wayne Lewis   The FEI Titan family currently offers the Titan 80-300 kV S/TEM, the world’s most...

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