by mroseboro | Jun 24, 2021 | Electron Imaging Center for Nanomachines, Research, Technology Centers, Tools for Discovery |
TECHNOLOGY CENTER ANNOUNCEMENT Next-gen electron source boosts resolution for atomic imaging X-FEG upgrades electron microscopy capabilities for CNSI at UCLA users by Wayne Lewis The FEI Titan family currently offers the Titan 80-300 kV S/TEM, the world’s most...
by mroseboro | Dec 7, 2020 | Electron Imaging Center for Nanomachines, News, Research, Tools for Discovery, Uncategorized |
TECHNOLOGY CENTER NEWS New electron-detecting camera speeds up bio-imaging Upgraded cryo-electron microscopy tool available at CNSI at UCLA by Wayne Lewis With the addition of the Gatan K3 direct electron camera (inset), CNSI’s legendary Titan Krios microscope—the...
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